Verification and Testing Techniques for Reliable System on Chip Solutions

Abstract

Verification and Testing Techniques for Reliable System on Chip (SoC) Solutions is a class of research article that investigates the difficulties and advances in making certain that present day SoC outlines are dependable and accessible. With SoCs integrating complex components such as processors, memory and peripheral interface into a single chip, it becomes increasingly important to have efficient verification and testing methodologies. Simulation based verification, formal verification and emulation are some of the kinds of various form of verification that this article describes, along with various things it does to point out design flaw so that they can be identified early in the development process. Furthermore, testing strategies including scan based testing, built-in self test (BIST) and multi-level testing techniques, are also addressed for detecting faults and to achieve the eventual long term reliability of the SoC solutions. The paper examines emerging trends, including machine learning assisted verification, that holds potential to improve the efficiency of classic verification techniques. The article ultimately offers a comprehensive summary of strategies applicable for achieving robust and reliable SoC designs in a rapidly growing number of potential contaminates in the electronic landscape.