EL MANAA BARHOUMIA; T SHIMADA. Transformer-Based Deep Feature Learning for AI-Enhanced Fault Diagnosis in Deep Submicron VLSI Circuits. Progress in Electronics and Communication Engineering, [S. l.], v. 3, n. 2, p. 10–14, 2025. DOI: 10.31838/ECE/03.02.02. Disponível em: https://ecejournals.in/index.php/PECE/article/view/425.. Acesso em: 7 dec. 2025.